Reputation management : the key to successful public relations and corporate communication by John Doorley and Helio Fred Garcia

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TextLanguage: English Publication details: New York: Routledge 2011Edition: 2nd edDescription: xxvii, 428p., note, ind. 25 cm x 18 cmISBN:

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Item type	Current library	Call number	Materials specified	Status	Date due	Barcode
Books	KEIC	658.45 DOO (Browse shelf(Opens below))		Available		10653

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